X0000110 Search Results

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

bct8240a

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

SN54BCT8244A

Abstract: SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­

SN74BCT373

Abstract: SN74BCT8373 SN74F373
Contextual Info: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and

74BCT8374

Abstract: D3641 TEX-E wire
Contextual Info: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW

F504

Abstract: PDIP28 ST52F500 ic 4060 internal circuit afb3
Contextual Info: ST52F500/F503/F504 ST52F500/F503/F504  8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Matrix LED Display Driver

Abstract: 4-digit counter MAX6952 MAX6953EAX MAX6953EPL MAX6953 MAX6953E
Contextual Info: 19-2312; Rev 3; 3/04 2-Wire Interfaced, 2.7V to 5.5V, 4-Digit 5 ✕ 7 Matrix LED Display Driver Features ♦ 400kbps 2-Wire Interface Compatible with I2C The MAX6953 is a compact cathode-row display driver that interfaces microprocessors to 5 ✕ 7 dot-matrix LED

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: ST52F500/F503/F504 ST52F500/F503/F504  8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)

Contextual Info: ST52F501L/F502L ST52F501L/F502L  8-BIT INTELLIGENT CONTROLLER UNIT ICU IR Driver, Timer/PWM, I2C, SCI, Low Voltage TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 256 bytes Data EEPROM

BCT244

Abstract: F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

ldpr 006h

Abstract: F502L ST52F501L ST52F502L 9.830 mhz
Contextual Info: ST52F501L/F502L ST52F501L/F502L 8-BIT INTELLIGENT CONTROLLER UNIT ICU IR Driver, Timer/PWM, I2C, SPI, SCI, Low Voltage PRODUCT PREVIEW Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ 256 bytes of Register File ■ 256 bytes of RAM ■ 256 bytes Data EEPROM (F502L only)

V5050

Abstract: F373 SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments D D D D D SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

d3413

Abstract: BCT8244 54BCT8244 SCBS042-TI0037-D3413 74BCT8244 74BCT244 SN74BCT8244 Texas Instruments bct8244
Contextual Info: SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042— TI0037— D3413, FEBRUARY 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8244 . . . JT PACKAGE SN74BCT6244 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits

BCT8244A

Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This